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PHYC40560

Academic Year 2024/2025

Advanced Atomic Force Microscopy for Bionanoscience (PHYC40560)

Subject:
Physics
College:
Science
School:
Physics
Level:
4 (Masters)
Credits:
5
Module Coordinator:
Professor Brian Rodriguez
Trimester:
Autumn
Mode of Delivery:
On Campus
Internship Module:
No
How will I be graded?
Letter grades

Curricular information is subject to change.

The atomic force microscope (AFM) is one of the family of scanning probe microscopes, and is widely used for biological and nanotechnological applications. This module covers the basic principles of AFM including: cantilever design; approach mechanisms; cantilever deflection detection techniques, modes of operation; quantitative measurements; force-distance curves; force-extension curves; and imaging.

About this Module

Learning Outcomes:

This module starts off with the underlying principles of atomic force microscopy both for static and dynamic measurements at the nanoscale. We will then cover each constituent component of the microscope including design criteria and calibration. This will be followed by exploring the range of applications of AFM in the life sciences and nanotechnology. The module will include practical hands on experience of atomic force microscopy via a series of practicals so that you are well-equipped to apply AFM during the project component of the MSc course if you wish to do so.

Student Effort Hours:
Student Effort Type Hours
Lectures

18
Tutorial

6
Laboratories

42
Autonomous Student Learning

59
Total

125

Approaches to Teaching and Learning:
Lectures
Supplementary reading materials and online content
Hands on lab work
Self-directed homework
Student presentations with peer feedback
Scientific writing
Data analysis

Requirements, Exclusions and Recommendations

Not applicable to this module.


Module Requisites and Incompatibles
Not applicable to this module.
 

Assessment Strategy
Description Timing Component Scale Must Pass Component % of Final Grade In Module Component Repeat Offered
Assignment(Including Essay): There will be various assignments, typically 3-4 problem sheets, 3-4 data analysis reports, 1 full practical report, and 1 presentation. The due dates vary across the weeks selected. Week 1, Week 2, Week 3, Week 4, Week 5, Week 6, Week 7, Week 8, Week 9, Week 10, Week 11, Week 12 Standard conversion grade scale 40% No
50
 No
Exam (In-person): End of semester exam. End of trimester
Duration:
2 hr(s)
 Standard conversion grade scale 40% No
50
 Yes

Carry forward of passed components
No
 

Remediation Type Remediation Timing
In-Module Resit Prior to relevant Programme Exam Board
Please see Student Jargon Buster for more information about remediation types and timing. 

Feedback Strategy/Strategies

• Feedback individually to students, on an activity or draft prior to summative assessment
• Feedback individually to students, post-assessment
• Group/class feedback, post-assessment
• Peer review activities
• Self-assessment activities

How will my Feedback be Delivered?

You will receive feedback individually and as a group for continuous assessment activities. Peer feedback during practicals and presentations will also be utilised.

Fundamentals of Atomic Force Microscopy. Part I: Foundations by Ronald Reifenberger
Quantitative Data Processing in Scanning Probe Microscopy by Petr Klapetek

Timetabling information is displayed only for guidance purposes, relates to the current Academic Year only and is subject to change.
Autumn Practical Offering 1 Week(s) - Autumn: All Weeks Fri 09:00 - 16:50
Autumn Lecture Offering 1 Week(s) - Autumn: All Weeks Thurs 13:00 - 13:50
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