CHEN40510 Advanced Characterisation Tech

Academic Year 2021/2022

This course will focus on the techniques relevant for the characterisation of a wide range of material and surface/interface analysis relating to high technology industries including Semiconductor, Medical Device, Pharmaceutical, and Aerospace. These techniques are varied but focus on high resolution imaging and chemical properties of materials. The primary techniques covered will be Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Focused Ion Beam (FIB), X-Ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS). Students will have access to the characterisation equipment in the UCD Nano Imaging and Material Analysis Centre (NIMAC).

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Curricular information is subject to change

Learning Outcomes:

The students will be expected to understand the basic principles, advantages and limitations of the analytical techniques presented in the course. Furthermore, course participants will understand the requirements for samples suitable for each technique and the associated sample preparation methods used. They should also be able to perform simple and routine operations on the experimental setups. This will give the students the knowledge and understanding required to select the most suitable technique in order that they can obtain the required material properties.

Student Effort Hours: 
Student Effort Type Hours
Lectures

24

Laboratories

12

Autonomous Student Learning

90

Total

126

Approaches to Teaching and Learning:
Lectures
Seminars
Case studies
Laboratory work 
Requirements, Exclusions and Recommendations

Not applicable to this module.


Module Requisites and Incompatibles
Not applicable to this module.
 
Assessment Strategy  
Description Timing Open Book Exam Component Scale Must Pass Component % of Final Grade
Project: < Description > Unspecified n/a Graded No

20

Assignment: TEM assignment Week 10 n/a Graded No

30

Continuous Assessment: questions on the content, midterm Week 8 n/a Graded No

20

Assignment: XPS assignment Week 12 n/a Graded No

30


Carry forward of passed components
No
 
Resit In Terminal Exam
Summer Yes - 2 Hour
Please see Student Jargon Buster for more information about remediation types and timing. 
Feedback Strategy/Strategies

• Group/class feedback, post-assessment

How will my Feedback be Delivered?

Not yet recorded.