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Curricular information is subject to change
On completion of this Module, students should be able to use various techniques to characterise a given surface including: low energy electron diffraction (LEED); reflection high enenergy electron diffraction (RHEED); photoelectron diffraction; x-ray photoelectron spectroscopy (XPS); electron spectroscopy for chemical analysis (ESCA); Auger electron spectroscopy (AES); scanning Auger microscopy (SAM); secondary ion mass spectrometry (SIMS) and various other mass spectrometric techniques; scanning tunneling microscope (STM); atomic force microscopy.
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Basic undergraduate physics or chemistry
Not yet recorded