Learning Outcomes:
On completion of this Module, students should be able to use various techniques to characterise a given surface including: low energy electron diffraction (LEED); reflection high enenergy electron diffraction (RHEED); photoelectron diffraction; x-ray photoelectron spectroscopy (XPS); electron spectroscopy for chemical analysis (ESCA); Auger electron spectroscopy (AES); scanning Auger microscopy (SAM); secondary ion mass spectrometry (SIMS) and various other mass spectrometric techniques; scanning tunneling microscope (STM); atomic force microscopy.