Not recorded
The atomic force microscope (AFM) is one of the family of scanning probe microscopes, and is widely used for biological and nanotechnological applications. This module covers the basic principles of AFM including: cantilever design; approach mechanisms; cantilever deflection detection techniques, modes of operation; quantitative measurements; force-distance curves; force-extension curves; and imaging.
About this Module
Student Effort Hours:
Student Effort Type | Hours |
---|---|
Not yet recorded. |
Requirements, Exclusions and Recommendations
Not applicable to this module.
Module Requisites and Incompatibles
Not applicable to this module.
Assessment Strategy
Description | Timing | Component Scale | % of Final Grade | ||
---|---|---|---|---|---|
Not yet recorded. |
Carry forward of passed components
Not yet recorded
Not yet recorded
Remediation Type | Remediation Timing |
---|---|
Not yet recorded |
Not yet recorded